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CT-ALPHA Nanotube
One main component of the system is Excillum’s high performance X‑ray source NanoTube N2, a up to 110 kV X‑ray tube with latest tungsten-diamond transmission target technology, automatic e‑beam focusing and astigmatism correction, ensuring that the smallest possible, truly round X‑ray spot is achieved.
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Industrial CT Scanning Services
Computed tomography (CT) is also referred to as industrial x ray and industrial imaging. It is an x-ray methodology yielding 3-dimensional (3D) results by placing an object on a rotational stage between an x-ray tube and x ray detector, rotating the object 360 degrees and capturing images at specific intervals—such as every degree or every half degree.
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CT MINI
The table system with minimum space requirement for the investigation of plastics, ceramics and new materials. The CT-MINI computer tomograph from ProCon X‑Ray GmbH impresses with excellent CT results in real time.
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CT COMPACT
The compact table system for high demands. In addition to plastics and ceramics, the CT-COMPACT computer topographer from ProCon X‑Ray GmbH also tests more absorbent materials such as metals and larger test parts with the best visualization quality.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE X-RAY XULM
Flexible measuring devices for coating thickness measurement of filigree parts like plugs, contacts or wires as well as for the determination of the metal content of electroplating baths and the composition of simple alloy layers.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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High Performance XRF Measuring Instrument
FISCHERSCOPE® X-RAY XAN® 250
Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement. Measurements according to DIN EN ISO 3497 and ASTM B 568.
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Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
